850nm VCSEL

Two or three inches epiwafers grown by MOVPE are available for 850nm vertical cavity surface emitting laser (VCSEL) fabrication.  The active region comprises three quantum wells of GaAs/Al0.3Ga0.7 As sandwiched by AlGaAs layers to form a resonant cavity between P- and N-DBR mirrors. Since N-DBR has higher reflection, the light is emitted from the P-DBR mirror to from the laser beam.  We offer two types of wafers for making either ion-implanted or oxide-confined lasing aperture.

Epitaxial Capability

 Parameters  Values
 SB Center  ±10nm of specified value
 Thickness uniformity  Better than ±2.5%
 PL Wavelength uniformity  ~±1.5nm at inner 40mm
 Doping control  30%
 P-AlGaAs doping (cm-3)  C doped; 5E17 to 1E20
 N-AlGaAs doping (cm-3)  Si doped; 1E17 to 5E18
 Al composition in AlxGa1-xAs  95% to 5%
 Defect density control (Diameter)  <100cm-2 (D>10μm)

 

Device Performance

 Parameter  Symbol  Typical
 Threshold Current @25℃  Ith  <4mA (Aperture~10μm)
 Wavelength  λ  845~855nm
 Slope efficiency  η  >0.3 W/A
 Serial resistance  Rs  <50Ω
 Operating temperature  0~80℃
 Type  Oxidation Confined Aperture